Tuesday, May 29, 2012

Book Chapter: Test, Defect Tolerance and Reliability for Emerging Nanotechnologies

S. Bhanja, M. Ottavi, S. Pontarelli and F. Lombardi, “QCA Circuits for Robust Coplanar
Crossing”, in “Test, Defect Tolerance and Reliability for Emerging Nanotechnologies”, edited
by Mohammad Tehranipoor, Springer Science +Business Media, LLC, 2008.

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